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台式 X 射线荧光光谱仪

Benchtop XRF

Model No. BEX-0004 · X-Ray Analysis Instruments

Benchtop Micro-XRF Spectrometer

台式微区 XRF 光谱仪

Failure analysts, geologists and conservators who need elemental maps without a floor-standing instrument can use this benchtop micro-XRF. It focuses to 10–100 µm, scans a 100 × 100 mm stage with 1 µm resolution and produces point, line or area maps from Na to U. Typical limits are 10–1000 mg/kg. Tell us your typical sample dimensions.

Spot size
10–100 µm
Element range
Na to U
Detection limit
10–1000 mg/kg typical
Stage travel
up to 100 × 100 mm
Stage resolution
1 µm
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Packing & Shipping

Place of originChina (dispatched from Shanghai)
BrandLiquid International / OEM on request
Export packingFumigation-free plywood case or reinforced carton
Loading portShanghai / Ningbo (others on request)
Payment termsT/T, L/C at sight (confirmed on quotation)
Trade termsEXW, FOB, CFR, CIF, DAP

Typical export terms — final terms are confirmed on the proforma invoice.

Product Description 产品描述

Failure analysts, geologists and conservators who need elemental maps without a floor-standing instrument can use this benchtop micro-XRF. It focuses to 10–100 µm, scans a 100 × 100 mm stage with 1 µm resolution and produces point, line or area maps from Na to U. Typical limits are 10–1000 mg/kg. Tell us your typical sample dimensions.

Highlights

  • Micron-scale mapping on a benchtop
  • Finds contaminant particles on boards and parts
  • Non-destructive for heritage and evidence items
  • Silicon drift detector for fast mapping

Applications

  • Mineral inclusions and geological phases
  • Coating, solder and electronics analysis
  • Contamination particles and failure analysis
  • Cultural heritage and archaeological objects

Specifications 技术参数

ParameterValue
Spot size 斑点尺寸 10–100 µm
Element range 元素范围 Na to U
Detection limit 检出限 10–1000 mg/kg typical
Stage travel 台行程 up to 100 × 100 mm
Stage resolution 台分辨率 1 µm
X-ray tube power X 射线管功率 30–100 W
Detector 检测器 silicon drift detector
Mapping 成像方式 point, line and area maps
Enclosure 外壳 shielded with interlocks
Interface 通信接口 Ethernet
Model No.BEX-0004
Place of originChina (dispatched from Shanghai)

Applicable standards 适用标准

ASTM E1621 Wavelength dispersive X-ray fluorescence IEC 62321 Determination of restricted substances in electrotechnical products ISO 3497 Metallic coatings — X-ray spectrometric thickness ASTM D4294 Sulfur in petroleum products by EDXRF IEC 61010-2-091 ISO/IEC 17025

Chinese national standards (GB/T, JJG) and international standards referenced for this product type. Test reports and certificates are supplied with the quotation on request.

Packing & Shipping 包装与运输

Export packing

Fumigation-free plywood case or reinforced carton

Every unit is power-tested before packing; enclosed in shock foam and moisture barrier; wooden cases comply with ISPM 15.

Loading port

Shanghai / Ningbo (others on request)

Full container load (FCL), less-than-container load (LCL) or air freight; complete export documentation provided.

Inquiry Now 索取报价

Complete the form below — an export engineer will send technical configurations and a formal proforma invoice within 24 hours.

Products in this inquiry: Benchtop Micro-XRF Spectrometer (BEX-0004)

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