X 射线衍射仪

X-Ray Diffractometers

X 射线衍射仪

X-Ray Diffractometers — X-Ray Analysis Instruments

Beyond routine powder work, these diffractometers target structure solution, thin films and mechanical properties. The range includes single-crystal and four-circle instruments for molecular structure, grazing-incidence thin-film systems, X-ray reflectometry for layer thickness and density, residual stress diffractometers for welds and machined parts, and small-angle scattering for nanostructures. Selection follows the measurement geometry your research or QC task requires.

6 models Range code XRA OEM available

Applicable standards

ASTM E915 Verifying the alignment of X-ray diffraction instrumentation ASTM E1426 Determining the effective elastic parameter for X-ray diffraction measurements of residual stress USP <941> X-Ray Diffraction ISO 20203 Carbonaceous materials — XRD of calcined coke ISO/IEC 17025 IEC 61010-2-091

How to specify

Residual stress work per ASTM E1426 needs elastic constants for your material.
Thin films under about 100 nm call for grazing incidence or reflectometry optics.
Single-crystal buyers should specify crystal size range and low-temperature device needs.

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