Model No. BEX-0004
Benchtop Micro-XRF Spectrometer台式微区 XRF 光谱仪
- Spot size
- 10–100 µm
- Element range
- Na to U
X 射线衍射仪
X-Ray Diffractometers
Photo for reference; configuration may vary by order.
Model No. XRA-0003 · X-Ray Analysis Instruments
Thin-Film X-Ray Diffractometer with Grazing Incidence
掠入射薄膜 X 射线衍射仪
Barrier layers, hard coatings and oxide films only a few nanometres thick disappear in conventional scans. This thin-film diffractometer uses grazing incidence of 0.1–5° with parallel-beam mirror optics to probe films from 1 nm to 10 µm, accommodating wafers up to 200 mm. Rocking curves and pole figures are available for texture. Tell us film thickness and substrate.
- Incidence angle
- 0.1–5°
- 2-theta range
- 0–120°
- Optics
- parallel beam with mirror
- Detector
- line or area detector
- Film thickness
- 1 nm to 10 µm
Packing & Shipping
| Place of origin | China (dispatched from Shanghai) |
|---|---|
| Brand | Liquid International / OEM on request |
| Export packing | Fumigation-free plywood case or reinforced carton |
| Loading port | Shanghai / Ningbo (others on request) |
| Payment terms | T/T, L/C at sight (confirmed on quotation) |
| Trade terms | EXW, FOB, CFR, CIF, DAP |
Typical export terms — final terms are confirmed on the proforma invoice.
Product Description 产品描述
Barrier layers, hard coatings and oxide films only a few nanometres thick disappear in conventional scans. This thin-film diffractometer uses grazing incidence of 0.1–5° with parallel-beam mirror optics to probe films from 1 nm to 10 µm, accommodating wafers up to 200 mm. Rocking curves and pole figures are available for texture. Tell us film thickness and substrate.
Highlights
- Grazing incidence boosts signal from very thin films
- Accepts wafers up to 200 mm
- Rocking curves for epitaxial quality
- Parallel-beam optics tolerate uneven surfaces
Applications
- Semiconductor thin film and barrier layers
- Optical and hard coatings
- Epitaxial film and substrate relationships
- Corrosion and oxide layer analysis
Specifications 技术参数
| Parameter | Value |
|---|---|
| Incidence angle 入射角 | 0.1–5° |
| 2-theta range 2-theta 范围 | 0–120° |
| Optics 光学 | parallel beam with mirror |
| Detector 检测器 | line or area detector |
| Film thickness 薄膜厚度 | 1 nm to 10 µm |
| X-ray tube power X 射线管功率 | 1–3 kW |
| Sample size 样品尺寸 | up to 200 mm wafers |
| Texture measurement 织构测量 | rocking curves and pole figures |
| Atmosphere 测量气氛 | air or vacuum |
| Interface 通信接口 | Ethernet |
| Model No. | XRA-0003 |
| Place of origin | China (dispatched from Shanghai) |
Applicable standards 适用标准
ASTM E915 Verifying the alignment of X-ray diffraction instrumentation
ASTM E1426 Determining the effective elastic parameter for X-ray diffraction measurements of residual stress
USP <941> X-Ray Diffraction
ISO 20203 Carbonaceous materials — XRD of calcined coke
ISO/IEC 17025
IEC 61010-2-091
Chinese national standards (GB/T, JJG) and international standards referenced for this product type. Test reports and certificates are supplied with the quotation on request.
Packing & Shipping 包装与运输
Export packing
Fumigation-free plywood case or reinforced carton
Every unit is power-tested before packing; enclosed in shock foam and moisture barrier; wooden cases comply with ISPM 15.
Loading port
Shanghai / Ningbo (others on request)
Full container load (FCL), less-than-container load (LCL) or air freight; complete export documentation provided.
Inquiry Now 索取报价
Complete the form below — an export engineer will send technical configurations and a formal proforma invoice within 24 hours.
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