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表面轮廓仪

Surface Profilometers

Model No. SUP-0002 · Surface Analysis Instruments

White-Light Interferometric 3D Optical Profilometer

白光干涉三维光学轮廓仪

MEMS, semiconductor and optics teams that cannot touch the surface use white-light interferometry for areal roughness and step height. Vertical resolution is below 0.1 nm in PSI mode and about 1 nm in CSI mode, with a vertical scan of up to 10 mm. Objectives run 2.5×–100×, giving 0.05–5 mm fields. Step height repeatability is within 0.1%.

Vertical resolution
< 0.1 nm (PSI); ~1 nm (CSI)
Vertical scan range
Up to 10 mm
Objectives
2.5×–100×
Field of view
0.05–5 mm
Lateral resolution
0.35–4 µm (objective-dependent)
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Packing & Shipping

Place of originChina (dispatched from Shanghai)
BrandLiquid International / OEM on request
Export packingFumigation-free plywood case or reinforced carton
Loading portShanghai / Ningbo (others on request)
Payment termsT/T, L/C at sight (confirmed on quotation)
Trade termsEXW, FOB, CFR, CIF, DAP

Typical export terms — final terms are confirmed on the proforma invoice.

Product Description 产品描述

MEMS, semiconductor and optics teams that cannot touch the surface use white-light interferometry for areal roughness and step height. Vertical resolution is below 0.1 nm in PSI mode and about 1 nm in CSI mode, with a vertical scan of up to 10 mm. Objectives run 2.5×–100×, giving 0.05–5 mm fields. Step height repeatability is within 0.1%.

Highlights

  • Sub-nanometre vertical resolution in PSI mode
  • Vertical scan range up to 10 mm
  • Objective choice from 2.5× to 100×
  • High-NA optics measure slopes up to about 70°

Applications

  • MEMS and semiconductor topography
  • Optical surface roughness
  • Polished metal and ceramic analysis
  • Thin film step height

Specifications 技术参数

ParameterValue
Vertical resolution 垂直分辨率 < 0.1 nm (PSI); ~1 nm (CSI)
Vertical scan range 垂直扫描范围 Up to 10 mm
Objectives 物镜 2.5×–100×
Field of view 视场 0.05–5 mm
Lateral resolution 横向分辨率 0.35–4 µm (objective-dependent)
Camera 相机 1–5 MP
Step height repeatability 台阶高度重复性 ≤ 0.1% (1σ)
Maximum slope 最大斜率 ≈ 30° (smooth), up to 70° with high NA
Sample size 样品尺寸 Up to 200 × 200 mm, 100 mm height
Measurement time 测量时间 5–60 s per field
Model No.SUP-0002
Place of originChina (dispatched from Shanghai)

Applicable standards 适用标准

ISO 4287 ISO 21920-2 ISO 25178-2 ISO 4288 ASTM D7127

Chinese national standards (GB/T, JJG) and international standards referenced for this product type. Test reports and certificates are supplied with the quotation on request.

Packing & Shipping 包装与运输

Export packing

Fumigation-free plywood case or reinforced carton

Every unit is power-tested before packing; enclosed in shock foam and moisture barrier; wooden cases comply with ISPM 15.

Loading port

Shanghai / Ningbo (others on request)

Full container load (FCL), less-than-container load (LCL) or air freight; complete export documentation provided.

Inquiry Now 索取报价

Complete the form below — an export engineer will send technical configurations and a formal proforma invoice within 24 hours.

Products in this inquiry: White-Light Interferometric 3D Optical Profilometer (SUP-0002)

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