表面轮廓仪
Roughness and form data are written into drawings for machined parts, wafers, optics and coatings, so the measuring method must match the specification. Our profilometers include contact stylus instruments, white-light interferometers and confocal laser systems for non-contact 3D maps, portable testers for the shop floor and an AFM option for nanoscale texture. Parameters can be evaluated to ISO 21920-2, ISO 25178-2, ISO 4287 and ISO 4288.
Single instruments, complete laboratories or government tenders — our export engineers prepare the configuration, proforma invoice and shipping documents.
